In order to perform inelastic light scattering studies and scanning probe microscopy based experiments of samples under uniaxial strain, within Strained FeSC project we designed, developed and fabricated a piezoelectric-based device. For that purpose, we followed designs of similar devices for applying continuously tunable uniaxial strain that had been devised, successfully used, and publicly available [1,2]. These designs were adapted for the purposes of inelastic light scattering and scanning probe microscopy base experiments, having in mind the compatibility with the available and the cryostat that will be procured.

Picture of the fabricated sample holder is displayed in Fig. 1(a). As can be seen, the device consists of three piezoelectric stacks connected with a bridge. Wires are used in order to apply bias voltage on the piezoelectric stacks. When the inner piezoelectric stack is extended (in the direction opposite to the bridge), the moveable sample plate is pushed toward the fixed sample plate which results in sample compression. On the other hand, when two external piezoelectric stacks are extended (in the direction toward the bridge), the whole bridge and the moveable sample plate are moved from the fixed sample plate, thus resulting in a sample extension. In order to follow and measure applied strain on the piezoelectric stacks, appropriate strain gauge was glued between fixed and moveable sample plate as depicted in Fig. 1(b).